학술논문
A guided debugger-based fault injection methodology for assessing functional test programs
Document Type
Conference Paper
Source
In: Proceedings of the IEEE VLSI Test Symposium , Proceedings - 2023 IEEE 41st VLSI Test Symposium, VTS 2023. (Proceedings of the IEEE VLSI Test Symposium, 2023, 2023-April)
Subject
Language
English