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A test vector selection method based on machine learning for efficient presilicon verification
Document Type
Article
Author
Lim, H.G.; Kim, C.O.; Jang, J.; Ju, B.K.; Ko, J.W.
Source
In: Expert Systems with Applications. (Expert Systems with Applications, 15 August 2023, 224)
Subject
Language
English
ISSN
09574174

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