학술논문
Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests
Document Type
Conference Paper
Author
Source
In: IEEE International Reliability Physics Symposium Proceedings , 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, March 2021, 2021-March)
Subject
Language
English
ISSN
15417026