학술논문
A study of slow erasing speed at edge cell in nano-scale NAND flash memory
Document Type
Conference Paper
Author
Source
In: International Symposium on VLSI Technology, Systems, and Applications, Proceedings , 2008 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA. (International Symposium on VLSI Technology, Systems, and Applications, Proceedings, 2008, :87-88)
Subject
Language
English