학술논문
NTIRE 2020 challenge on real-world image super-resolution: Methods and results
Document Type
Conference Paper
Author
Lugmayr, A.; Danelljan, M.; Timofte, R.; Liu, Z.-S.; Cani, M.-P.; Siu, W.-C.; Wang, L.-W.; Yang, F.; Yang, H.; Fu, J.; Chen, J.; Li, H.; Shi, Y.; Kim, G.; Ko, H.; Lee, K.; Park, J.; Lee, J.; Min, J.; Lee, B.; Ahn, N.; Sohn, K.-A.; Yoo, J.; Micheloni, C.; Umer, R.M.; Lu, Y.; Michelini, P.N.; Hu, F.; Wang, Y.; Wang, H.; Peng, J.; Cheng, K.; Zhuo, H.; Cao, Y.; Ji, X.; Tai, Y.; Wang, C.; Li, J.; Huang, F.; Wu, H.; Liu, S.; Yang, B.; Zong, Z.; Liu, Z.; Zou, X.; Liu, X.; Chen, S.; Zhao, L.; Wang, Z.; Lin, Y.; Jia, X.; Zhou, Y.; Gao, Q.; Deng, W.; Bai, D.; El-Khamy, M.; Kheradmand, A.; Lee, J.; Ren, H.; Wang, S.; Chun, S.; Prajapati, K.; Patel, H.; Chudasama, V.; Upla, K.; Ramachandra, R.; Raja, K.; Busch, C.; Cai, J.; Ho, C.M.; Meng, Z.; Seo, Y.H.; Wu, T.H.; Zhao, T.
Source
In: IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops , Proceedings - 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2020. (IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, June 2020, 2020-June:2058-2076)
Subject
Language
English
ISSN
21607516
21607508
21607508