학술논문
Sub-30nm scaling and high-speed operation of fully-confined Access-Devices for 3D crosspoint memory based on mixed-ionic-electronic-conduction (MIEC) materials
Document Type
Conference Paper
Author
Source
In: Technical Digest - International Electron Devices Meeting, IEDM , 2012 IEEE International Electron Devices Meeting, IEDM 2012. (Technical Digest - International Electron Devices Meeting, IEDM, 2012, :2.7.1-2.7.4)
Subject
Language
English
ISSN
01631918