학술논문

‘Box-Profile’ Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry
Document Type
Article
Source
In: Geostandards and Geoanalytical Research. (Geostandards and Geoanalytical Research, 1 December 2019, 43(4):531-541)
Subject
Language
English
ISSN
1751908X
16394488