학술논문

Depth analysis of local conformation in poly(methyl methacrylate) adsorbed onto SiOx studied by soft X-ray absorption spectroscopy combined with an Ar gas cluster ion beam
Document Type
Article
Source
In: Polymer Journal. (Polymer Journal, March 2024, 56(3):215-220)
Subject
Language
English
ISSN
13490540
00323896