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Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements

Document Type

Article

Author

Kim, H.-S.; Peric, N.; Minj, A.; Wouters, L.; Serron, J.; Mancini, C.; Koylan, S.; Sergeant, S.; Hantschel, T.

Source

In: Nanotechnology. (Nanotechnology, 24 June 2024, 35(26))

Subject

Language

English

ISSN

13616528
09574484

Online Access

Full Text (IOP Science) Full Text (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

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