학술논문
X-Masking for In-System Deterministic Test
Document Type
Conference Paper
Author
Source
In: Proceedings of the European Test Workshop , Proceedings - 2022 IEEE European Test Symposium, ETS 2022. (Proceedings of the European Test Workshop, 2022, 2022-May)
Subject
Language
English
ISSN
15581780
15301877
15301877