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Increased diagnostic yield from negative whole genome-slice panels using automated reanalysis

Document Type

Article

Author

Berger, S.I.; Cohen, A.J.; Andrew, E.H.; Fraser, J.; Regier, D.S.; Pitsava, G.; Délot, E.C.; LoTempio, J.; Marmolejos, S.; Knoblach, S.; Ko, A.; Vilain, E.; Martin, G.M.; Kahn-Kirby, A.H.; Smith, E.; Fusaro, V.A.; Albert, J.; Meltzer, B.

Source

In: Clinical Genetics. (Clinical Genetics, September 2023, 104(3):377-383)

Subject

Language

English

ISSN

13990004
00099163

Online Access

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

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