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Chip-based in situ TEM investigation of structural thermal instability in aged layered cathode

Document Type

Article

Author

Wang, Y.; Liao, X.; Zhao, Y.; Sun, C.; Yuan, Y.; Van Tendeloo, G.

Source

In: Nanoscale Advances. (Nanoscale Advances, 14 July 2023, 5(16):4182-4190)

Subject

Language

English

ISSN

25160230

Online Access

Full Text (RSC Gold) Web of Science JCR 저널정보 Scopus Find it@PNU

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