학술논문
Performance and Reliability Optimization of Supercritical-Nitridation-Treated AlGaN/GaN High-Electron-Mobility Transistors
Document Type
Article
Author
Source
In: IEEE Transactions on Electron Devices . (IEEE Transactions on Electron Devices, September 2021, 68(9):4317-4321)
Subject
Language
English
ISSN
15579646
00189383
00189383