학술논문
Towards Atomic Scale Tomography Using Correlative 4-D STEM, Strain Mapping, and Atom Probe Tomography
Document Type
Article
Author
Source
In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada . (Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 22 July 2023, 29(1):603-604)
Subject
Language
English
ISSN
14358115