학술논문
Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process
Document Type
Conference Paper
Author
Source
In: Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT , Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, 2022, 2022-October)
Subject
Language
English
ISSN
2765933X
25761501
25761501