학술논문

Investigation of Vacancies Transport in the Bilayer of the Cu2O1-x/CuO1-y Resistive Switching Device and Effect of Growth Temperature on Memristive Switching
Document Type
Article
Source
In: ACS Applied Electronic Materials. (ACS Applied Electronic Materials, 26 December 2023, 5(12):6490-6499)
Subject
Language
English
ISSN
26376113