학술논문

Multiphase Reset Induced Reliable Dual-Mode Resistance Switching of the Ta/HfO2/RuO2 Memristor
Document Type
Article
Source
In: ACS Applied Materials and Interfaces. (ACS Applied Materials and Interfaces, 3 April 2024, 16(13):16462-16473)
Subject
Language
English
ISSN
19448252
19448244