학술논문
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs
Document Type
Conference Paper
Author
Source
In: IEEE International Reliability Physics Symposium Proceedings , 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, 2023, 2023-March)
Subject
Language
English
ISSN
15417026