학술논문

Short channel effects suppression in a dual-gate gate-all-around Si nanowire junctionless nMOSFET
Document Type
Conference Paper
Source
In: Proceedings of 9th International Conference on Electrical and Computer Engineering, ICECE 2016, Proceedings of 9th International Conference on Electrical and Computer Engineering, ICECE 2016. (Proceedings of 9th International Conference on Electrical and Computer Engineering, ICECE 2016, 13 February 2017, :538-541)
Subject
Language
English