학술논문
Digital pixel test structures implemented in a 65 nm CMOS process
Document Type
Article
Author
Aglieri Rinella, G.; Braach, J.; Buschmann, E.; Carnesecchi, F.; Cecconi, L.; Dannheim, D.; de Melo, J.; Deng, W.; di Mauro, A.; Hasenbichler, J.; Hillemanns, H.; Hong, G.H.; Junique, A.; Kluge, A.; Lautner, L.; Mager, M.; Martinengo, P.; Munker, M.; Piro, F.; Rebane, K.; Reidt, F.; Sanna, I.; Snoeys, W.; Šuljić, M.; Svihra, P.; Van Beelen, J.B.; Andronic, A.; Tiltmann, N.; Becht, P.; Masciocchi, S.; Menzel, M.W.; Beole, S.; Buckland, M.D.; Camerini, P.; Contin, G.; Villani, A.; Antonelli, M.; Baccomi, R.; Rachevski, A.; Charbon, E.; Isakov, A.; Kotliarov, A.; Křížek, F.; Aresti, M.; Marras, D.; Sarritzu, V.; Usai, G.; Russo, R.; Sonneveld, J.; Senyukov, S.; Vassilev, M.D.; Vernieri, C.
Source
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment . (Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, November 2023, 1056)
Subject
Language
English
ISSN
01689002