학술논문
Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry
Document Type
Article
Author
Source
In: ACS Nano . (ACS Nano, 23 May 2023, 17(10):9188-9196)
Subject
Language
English
ISSN
1936086X
19360851
19360851