학술논문
Influence of Interface trap distributions over the device characteristics of AlGaN/GaN/AlInN MOS-HEMT using Cubic Spline Interpolation technique
Document Type
Article
Source
In: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields . (International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, January/February 2022, 35(1))
Subject
Language
English
ISSN
10991204
08943370
08943370