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Bridge-contact resistance method for precise evaluation of electrical contacts of nano-scale semiconductor devices

Document Type

Article

Author

Yun, J.; Park, B.-G.; Jung, H.; Lee, J.; Park, Y.; Kang, G.; Park, H.; Park, H.

Source

In: Solid-State Electronics. (Solid-State Electronics, June 2024, 216)

Subject

Language

English

ISSN

00381101

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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