학술논문
VERT-X: VERTical X-ray raster-scan facility for ATHENA calibration. The concept design
Document Type
Conference Paper
Author
Moretti, A.; Pareschi, G.; Sironi, G.; Salmaso, B.; Basso, S.; Tagliaferri, G.; Spiga, D.; Uslenghi, M.; La Palombara, N.; Fiorini, M.; Tordi, M.; Bressan, R.; Dury, F.; Spinola, M.; Valsecchi, G.; Zocchi, F.; Marioni, F.; Attinà, P.; Amisano, F.; Parissenti, G.; Parodi, G.; Wille, E.; Corradi, P.; Bavdaz, M.; Ferreira, I.
Source
In: Proceedings of SPIE - The International Society for Optical Engineering , Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX. (Proceedings of SPIE - The International Society for Optical Engineering, 2019, 11119)
Subject
Language
English
ISSN
1996756X
0277786X
0277786X