학술논문

Thick film SOI technology: Characteristics of devices and performance of circuits for high-energy physics at cryogenic temperatures; effects of ionizing radiation
Document Type
Article
Source
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. (Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 21 December 1997, 401(2-3):229-237)
Subject
Language
English
ISSN
01689002