학술논문
Numerical Analysis of Impact Ionization Effects on Hard Switching in AlGaN/GaN HEMTs
Document Type
Article
Author
Source
In: IEEE Transactions on Electron Devices . (IEEE Transactions on Electron Devices, 1 December 2023, 70(12):6217-6224)
Subject
Language
English
ISSN
15579646
00189383
00189383