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Electrostatic force microscopy study about the hole trap in thin nitride/oxide/semiconductor structure

Document Type

Article

Author

Kim, J.-H.; Noh, H.; Khim, Z.G.; Jeon, K.S.; Park, Y.J.; Yoo, H.; Choi, E.; Om, J.

Source

In: Applied Physics Letters. (Applied Physics Letters, 2008, 92(13))

Subject

Language

English

ISSN

00036951

Online Access

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

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