학술논문
Materials screening workflow methodologies for metal oxides and chalcogenides for use in novel devices
Document Type
Conference Paper
Author
Source
In: China Semiconductor Technology International Conference 2017, CSTIC 2017 , China Semiconductor Technology International Conference 2017, CSTIC 2017. (China Semiconductor Technology International Conference 2017, CSTIC 2017, 4 May 2017)
Subject
Language
English