학술논문
A 4-nm 1.15 TB/s HBM3 Interface With Resistor-Tuned Offset Calibration and In Situ Margin Detection
Document Type
Article
Author
Source
In: IEEE Journal of Solid-State Circuits . (IEEE Journal of Solid-State Circuits, 1 January 2024, 59(1):231-242)
Subject
Language
English
ISSN
1558173X
00189200
00189200