학술논문
Rapid whole-genome mutational profiling using next-generation sequencing technologies
Document Type
Article
Author
Smith, D.R.; Makowsky, K.; Tao, W.; Woolf, B.; Shen, L.; Donahue, W.F.; Tusneem, N.; Quinlan, A.R.; Stromberg, M.P.; Stewart, D.A.; Zhang, L.; Marth, G.T.; Peckham, H.E.; Ranade, S.S.; Warner, J.B.; Lee, C.C.; Coleman, B.E.; Zhang, Z.; McLaughlin, S.F.; Malek, J.A.; Sorenson, J.M.; Blanchard, A.P.; McKernan, K.J.; Chapman, J.; Hillman, D.; Chen, F.; Rokhsar, D.S.; Richardson, P.M.; Jeffries, T.W.
Source
In: Genome Research . (Genome Research, October 2008, 18(10):1638-1642)
Subject
Language
English
ISSN
10889051
15495469
15495469