학술논문
Unraveling the Wake-Up Mechanism in Ultrathin Ferroelectric Hf0.5 Zr0.5O: Interfacial Layer Soft Breakdown and Physical Modeling
Document Type
Article
Author
Source
In: IEEE Transactions on Electron Devices . (IEEE Transactions on Electron Devices, 1 May 2024, 71(5):3365-3370)
Subject
Language
English
ISSN
15579646
00189383
00189383