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Probing Inherent Optical Anisotropy in Substrates via Direct Nanoimaging of Mie Scattering

Document Type

Article

Author

Woo, H.J.; Han, J.; Ji, S.; Shin, B.G.; Hwang, E.; Kim, J.; Song, Y.J.; Park, S.H.; Yi, G.-R.; Lee, S.-G.; Lee, C.-W.; Kim, D.-S.; Choi, S.; Jeong, M.S.

Source

In: ACS Nano. (ACS Nano, 14 May 2024, 18(19):12333-12340)

Subject

Language

English

ISSN

1936086X
19360851

Online Access

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

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