학술논문
Analysis of Hump Effect Induced by Positive Bias Temperature Instability in the Local Oxidation of Silicon n-MOSFETs
Document Type
Article
Author
Source
In: IEEE Transactions on Device and Materials Reliability . (IEEE Transactions on Device and Materials Reliability, June 2023, 23(2):263-268)
Subject
Language
English
ISSN
15582574
15304388
15304388