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Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution

Document Type

Article

Author

Aryshev, A.; Terunuma, N.; Urakawa, J.; Ainsworth, R.; Aumeyr, T.; Bergamaschi, M.; Boogert, S.T.; Karataev, P.; Kruchinin, K.; Nevay, L.; Kieffer, R.; Lefevre, T.; Mazzoni, S.

Source

In: Journal of Instrumentation. (Journal of Instrumentation, 17 January 2020, 15(1))

Subject

Language

English

ISSN

17480221

Online Access

Full Text (IOP Science) Full Text (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

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