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Direct Assessment of Defective Regions in Monolayer MoS2 Field-Effect Transistors through In Situ Scanning Probe Microscopy Measurements

Document Type

Article

Author

Minj, A.; Mootheri, V.; Banerjee, S.; Nalin Mehta, A.; Serron, J.; Hantschel, T.; Asselberghs, I.; Goux, L.; Kar, G.S.; Heyns, M.; Lin, D.H.C.

Source

In: ACS Nano. (ACS Nano, 16 April 2024, 18(15):10653-10666)

Subject

Language

English

ISSN

1936086X
19360851

Online Access

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

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