학술논문
Exploring Performance and Reliability Behavior of Nanosheet Channel Thin-Film Transistors under Independent Dual Gate Bias Operation
Document Type
Article
Author
Source
In: ECS Journal of Solid State Science and Technology . (ECS Journal of Solid State Science and Technology, October 2023, 12(10))
Subject
Language
English
ISSN
21628777
21628769
21628769