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Top-down patterning of topological surface and edge states using a focused ion beam

Document Type

Article

Author

Bake, A.; Zhao, W.; Wang, X.; Cortie, D.; Zhang, Q.; Nguyen, A.; Akhgar, G.; Karel, J.; Cole, J.H.; Valanoor, N.; Ho, C.S.; Causer, G.L.; Yue, Z.; Lewis, R.; Mitchell, D.; Nancarrow, M.; Pastuovic, Z.

Source

In: Nature Communications. (Nature Communications, December 2023, 14(1))

Subject

Language

English

ISSN

20411723

Online Access

Full Text (ProQuest Central) Web of Science JCR 저널정보 Scopus Find it@PNU

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