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Semi-analytic off-axis X-ray source model

Document Type

Article

Author

Shamshad, M.; Anjomrouz, M.; Atharifard, A.; Aamir, R.; Panta, R.K.; Bheesette, S.; Bateman, C.J.; Butler, A.P.H.; Healy, J.L.; Smithies, D.J.; Walsh, M.F.; Goulter, B.P.; Bell, S.T.; Butler, P.H.; Lu, G.; Broeke, L.V.; Largeau, A.

Source

In: Journal of Instrumentation. (Journal of Instrumentation, 23 October 2017, 12(10))

Subject

Language

English

ISSN

17480221

Online Access

Full Text (IOP Science) Full Text (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

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