학술논문
Calculating activation energy (Ea) of SRAM product using the vmin variation method
Document Type
Conference Paper
Author
Source
In: Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA , 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2019. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, July 2019)
Subject
Language
English