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Characterization of nanoscale atomic motion of Si in polycrystalline Cu layer

Document Type

Article

Author

Takáts, V.; Bodnár, E.; Fodor, T.; Hakl, J.; Molnár, S.; Soha, M.; Vad, K.; Kaganovskii, Y.

Source

In: Heliyon. (Heliyon, 15 February 2024, 10(3))

Subject

Language

English

ISSN

24058440

Online Access

Full Text (ScienceDirect 종량제) Full Text (ScienceDirect O/A) Web of Science Scopus Find it@PNU

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