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Identification and thermal healing of focused ion beam-induced defects in GaN using off-axis electron holography

Document Type

Article

Author

Ji, K.; Schnedler, M.; Lan, Q.; Zheng, F.; Wang, Y.; Lu, Y.; Dunin-Borkowski, R.E.; Ebert, P.; Eisele, H.; Carlin, J.-F.; Butté, R.; Grandjean, N.

Source

In: Applied Physics Express. (Applied Physics Express, 1 January 2024, 17(1))

Subject

Language

English

ISSN

18820786
18820778

Online Access

Full Text (IOP) Open Access (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

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