학술논문
Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention
Document Type
Conference Paper
Source
In: IEEE International Reliability Physics Symposium Proceedings , 2023 IEEE International Reliability Physics Symposium, IRPS 2023 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, 2023, 2023-March)
Subject
Language
English
ISSN
15417026