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Built-in Self-prevention (BISP) for runtime ageing effects of TSVs in 3D ICs

Document Type

Article

Author

Maity, D.K.; Roy, S.K.; Giri, C.

Source

In: Integration. (Integration, January 2024, 94)

Subject

Language

English

ISSN

01679260

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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