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LET Calibration of Ion Microbeams and Their SEE Cross Section Characterization

Document Type

Article

Author

Peracchi, S.; Drury, R.; Pastuovic, Z.; Button, D.; Mann, M.; Cohen, D.D.; Brenner, C.; Williams, J.; Tran, L.T.; Guatelli, S.; Pan, V.; Archer, J.W.; Rosenfeld, A.B.; Coronetti, A.; Emriskova, N.; Alia, R.G.

Source

In: IEEE Transactions on Nuclear Science. (IEEE Transactions on Nuclear Science, 2024, 71(8):1565-1570)

Subject

Language

English

ISSN

15581578
00189499

Online Access

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

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