학술논문
Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy
Document Type
Article
Author
Source
In: International Journal of Nanotechnology , Special Issue on Nanotechnology in France III: C'Nano PACA. (International Journal of Nanotechnology, February 2012, 9(3-7):460-470)
Subject
Language
English
ISSN
14757435