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Numerical simulation and characterization of trapping noise in InGaP-GaAs heterojunctions devices at high injection

Document Type

Article

Author

Nallatamby, J.-C.; Abdelhadi, K.; Prigent, M.; Obregon, J.; Jacquet, J.-C.; Delage, S.; Floriot, D.

Source

In: Solid-State Electronics. (Solid-State Electronics, 2013, 81:35-44)

Subject

Language

English

ISSN

00381101

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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