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Radiation testing of low cost, commercial off the shelf microcontroller board

Document Type

Article

Author

Fried, T.; Cheneler, D.; Taylor, C.J.; Monk, S.D.; Di Buono, A.; Green, P.R.; Lennox, B.; Cockbain, N.; Dodds, J.M.

Source

In: Nuclear Engineering and Technology. (Nuclear Engineering and Technology, October 2021, 53(10):3335-3343)

Subject

Language

English

ISSN

2234358X
17385733

Online Access

Full Text (ScienceDirect 종량제) Full Text (ScienceDirect O/A) Web of Science JCR 저널정보 Scopus Find it@PNU

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