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Z-Scan theory for thin film measurements: Validation of a model beyond the standard approach using ITO and HfO2

Document Type

Article

Author

Tognazzi, A.; Cino, A.C.; Franceschini, P.; Vincenti, M.A.; De Angelis, C.; Tran, T.N.L.; Chiasera, A.; Akozbek, N.; Scalora, M.

Source

In: Optical Materials: X. (Optical Materials: X, July 2023, 19)

Subject

Language

English

ISSN

25901478

Online Access

Full Text (ScienceDirect 종량제) Full Text (ScienceDirect O/A) Scopus Find it@PNU

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