학술논문
Reliability Assessment of 60-GHz GaN Power Amplifier Under High-Level Input RF Stress
Document Type
Article
Author
Source
In: IEEE Transactions on Electron Devices . (IEEE Transactions on Electron Devices, 1 July 2024, 71(7):4087-4092)
Subject
Language
English
ISSN
15579646
00189383
00189383