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Effect of temperature on heavy ion-induced single event transient on 16-nm FinFET inverter chains

Document Type

Article

Author

Cai, L.; Ye, B.; Liu, Y.-Z.; He, Z.; Gao, S.; Hu, P.-P.; Yan, X.-Y.; Li, Z.-Z.; Liu, J.; Chi, Y.-Q.; Sun, Q.; Sun, R.-Q.; Wang, H.-B.

Source

In: Chinese Physics B. (Chinese Physics B, 1 April 2023, 32(4))

Subject

Language

English

ISSN

20583834
16741056

Online Access

Full Text (CAJ - Wanfang) Full Text (IOP Science) Full Text (IOP) Web of Science JCR 저널정보 Scopus Find it@PNU

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